Neutron reflectometry

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Science with neutrons
Foundations
Neutron temperature Flux, Radiation, Transport Cross section, Absorption, Activation
Neutron scattering
Neutron diffraction Small-angle neutron scattering GISANS Reflectometry Inelastic neutron scattering Triple-axis spectrometer Time-of-flight spectrometer Backscattering spectrometer Spin-echo spectrometer
Other applications
Neutron tomography Activation analysis, Prompt gamma activation analysis Fundamental research with neutrons: Ultracold neutrons, Interferometry Fast neutron therapy Neutron capture therapy
Infrastructure
Neutron sources: Research reactor, Spallation, Neutron moderator Neutron optics: Reflector, Supermirror Detection
Neutron facilities
America: HFIR, LANSCE, NIST CNR -SNS Oceania: OPAL Asia: J-PARC, HANARO Europe: BER II, FRM II, ILL, ISIS Neutron and Muon Source, JINR, SINQ Historic: IPNS, HFBR Under construction: ESS
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Neutron reflectometry is a neutron diffraction technique for measuring the structure of thin films, similar to the often complementary techniques of X-ray reflectivity and ellipsometry. The technique provides valuable information over a wide variety of scientific and technological applications including chemical aggregation, polymer and surfactant adsorption, structure of thin film magnetic systems, biological membranes, etc. It has become a technique widespread at reactor and spallation sources, with a wide range of available fitting software and standardised data formats.^[1]